EurekAlert April 1, 2021
The current single-shot readout of the nitrogen-vacancy electron spin relies on resonance fluorescence method at cryogenic temperature. However, the spin-flip process interrupts the optical cycling transition, therefore, limits the readout fidelity. Researchers in China have introduced a spin-to-charge conversion method assisted by near-infrared light to suppress the spin-flip error which leverages high spin-selectivity of cryogenic resonance excitation and flexibility of photoionization. They achieved an overall fidelity > 95% for the single-shot readout of an NV center electron spin in the presence of high strain and fast spin-flip process. With further improvements, this technique has the potential to achieve spin readout fidelity exceeding the fault-tolerant threshold and may also find applications on integrated optoelectronic devices…read more. Open Access TECHNICAL ARTICLE
Single-shot readout scheme based on SCC. Credit: Nature Communications volume 12, Article number: 1529 (2021)