TechXplore October 7, 2019
An international team of researchers (Switzerland, University of Southern California) has developed a technique called ptychographic X-ray laminography which utilizes x-rays from a synchrotron to illuminate a small region of a rotating chip at an angle of 61 degrees (with respect to the normal of the chip plane). The resulting diffraction patterns are measured with a photon-counting detector array. The data are used to generate high-resolution slice images of the chip, from which 3-D renderings are created. The 3-D image can be compared with the original design as a type of forensics to help companies or organizations that are looking to ensure chips are manufactured correctly and meet design specifications. It is possible to tell how and where they were manufactured. The process allows for reverse engineering of circuit designs without destroying the chip. By viewing a chip in detail, you can non-destructively figure out what it does therefore hiding intellectual property in a chip is not possible. The technology could one day contribute to a certification process to ensure the integrity of chips…read more. TECHNICAL ARTICLE
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