Phys.org  May 19, 2023 Despite recent progress in optical imaging and metrology there remains a substantial resolution gap between atomic-scale transmission electron microscopy and optical techniques. An international team of researchers (UK, Singapore) demonstrated atomic scale metrology by collecting single-shot images of the diffraction pattern of topologically structured light scattered on a suspended nanowire to determine its position relative to the fixed edges of the sample. They trained a deep learning algorithm that could predict the positions of a given nanowire based on the scattered light pattern recorded by the team’s sensor. If a sub-wavelength object moves in such a […]