Science Daily June 25, 2019
One way that heat damages electronic equipment is by making components expand at different rates, resulting in forces that cause micro-cracking and distortion. The valence fluctuations of Sm in samarium monosulfide (SmS) are known to induce possible large isotropic negative thermal expansion (NTE). Researchers in Japan prepared Ce-doped and Nd-doped SmS polycrystalline samples using a simpler method with much lower reaction temperature than the existing method. Typically, Sm0.80Ce0.20S exhibits giant NTE with total volume change of 2.6% in the wide temperature range from 330 K to 100 K, the lowest covered here. This research opens a new paradigm of thermal-expansion control that will make electronic devices more resilient to temperature changes…read more. TECHNICAL ARTICLEÂ
A new ‘golden’ age for electronics?
Posted in Advanced materials and tagged S&T Japan.