EurekAlert April 20, 2020 Researchers in Japan have demonstrated that large area suspended graphene nanomesh is quickly achievable by the helium ion beam microscopy with sub-10 nm nanopore diameter and well-controlled pitches. Comparing to slow speed TEM patterning, the helium ion beam milling technique overcomes the speed limitation, and meanwhile, provides a high imaging resolution. With the initial electrical measurements, they found that the thermal activation energy of the graphene nanomesh increased exponentially by increasing the porosity of the graphene nanomesh. This immediately provides a new method for bandgap engineering beyond the conventional nanoribbon method. The research provides a practical […]